{
  "_schema": "https://data.nist.gov/od/dm/nerdm-schema/v0.7#",
  "@context": [
    "https://data.nist.gov/od/dm/nerdm-pub-context.jsonld",
    {
      "@base": "ark:/88434/mds2-3732"
    }
  ],
  "@type": [
    "nrdp:DataPublication",
    "nrdp:PublicDataResource",
    "dcat:Dataset"
  ],
  "_extensionSchemas": [
    "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/PublicDataResource"
  ],
  "@id": "ark:/88434/mds2-3732",
  "ediid": "ark:/88434/mds2-3732",
  "version": "1.0.0",
  "doi": "doi:10.18434/mds2-3732",
  "title": "SRM 2562, Lot LL-202, Low-Energy Charpy V-Notch Specimens (Self-Verification, 21 \u00b0C, 8 mm Striker)",
  "contactPoint": {
    "fn": "Enrico Lucon",
    "hasEmail": "mailto:enrico.lucon@nist.gov"
  },
  "modified": "2025-02-18",
  "status": "available",
  "landingPage": "https://data.nist.gov/od/id/mds2-3732",
  "description": [
    "NIST self-verification Charpy specimens, such as lot LL-202 specimens considered here, are used by laboratories around the world to perform the indirect verification of their Charpy impact machine in accordance with ASTM E23 and/or ISO 148-2. For self-verification specimens, customers test between 5 and 7 samples and compare their average value with the NIST certified reference absorbed energy, provided in a certificate that accompanies the samples. If the mean absorbed energy is within the limits specified by the applicable test standard (ASTM or ISO), the machine indirect verification can be considered successful.\nThis record contains the certified value and uncertainty for lot LL-202, and the individual test results obtained from the certification process. More information on the Charpy Machine Verification Program is linked under References."
  ],
  "keyword": [
    "Charpy",
    "Impact"
  ],
  "theme": [
    "Standards: Reference materials",
    "Standards",
    "Standards: Certification"
  ],
  "topic": [
    {
      "@type": "Concept",
      "scheme": "https://data.nist.gov/od/dm/nist-themes/v1.1",
      "tag": "Standards: Reference materials"
    },
    {
      "@type": "Concept",
      "scheme": "https://data.nist.gov/od/dm/nist-themes/v1.1",
      "tag": "Standards"
    },
    {
      "@type": "Concept",
      "scheme": "https://data.nist.gov/od/dm/nist-themes/v1.1",
      "tag": "Standards: Certification"
    }
  ],
  "accessLevel": "public",
  "license": "https://www.nist.gov/open/license",
  "publisher": {
    "name": "National Institute of Standards and Technology",
    "@type": "org:Organization"
  },
  "language": [
    "en"
  ],
  "bureauCode": [
    "006:55"
  ],
  "programCode": [
    "006:052"
  ],
  "components": [
    {
      "@id": "cmps/2562_Lot_LL-202_Data.csv",
      "@type": [
        "nrdp:DataFile",
        "nrdp:DownloadableFile",
        "dcat:Distribution"
      ],
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"
      ],
      "filepath": "2562_Lot_LL-202_Data.csv",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-3732/2562_Lot_LL-202_Data.csv",
      "mediaType": "text/csv",
      "title": "Certification test results for LL-202",
      "size": 1470,
      "checksum": {
        "hash": "e667c2e5d8a2d5111c09d770cc47f94b496d50403bf8c29aeb4f505f9179146f",
        "algorithm": {
          "tag": "sha256",
          "@type": "Thing"
        }
      }
    },
    {
      "@id": "cmps/2562_Lot_LL-202_Readme.txt",
      "@type": [
        "nrdp:DataFile",
        "nrdp:DownloadableFile",
        "dcat:Distribution"
      ],
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"
      ],
      "filepath": "2562_Lot_LL-202_Readme.txt",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-3732/2562_Lot_LL-202_Readme.txt",
      "mediaType": "text/plain",
      "title": "Information about record 3732",
      "size": 3520,
      "checksum": {
        "hash": "5003b213eb1e8de38e579de05b963502063fc382a51d9f8b866f9c1be7f4d7e4",
        "algorithm": {
          "tag": "sha256",
          "@type": "Thing"
        }
      }
    },
    {
      "@id": "cmps/2562_Lot_LL-202_Certified_Values.csv",
      "@type": [
        "nrdp:DataFile",
        "nrdp:DownloadableFile",
        "dcat:Distribution"
      ],
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"
      ],
      "filepath": "2562_Lot_LL-202_Certified_Values.csv",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-3732/2562_Lot_LL-202_Certified_Values.csv",
      "mediaType": "text/csv",
      "title": "Certified values for LL-202",
      "size": 218,
      "checksum": {
        "hash": "940390590f566fb97bd2605fb66b2bc0705223921cfc3459922223c6398ebf82",
        "algorithm": {
          "tag": "sha256",
          "@type": "Thing"
        }
      }
    }
  ],
  "_editStatus": "done",
  "references": [
    {
      "@type": [
        "deo:BibliographicReference"
      ],
      "@id": "#ref:programs-projects/charpy-machine-verification-program",
      "refType": "IsSupplementTo",
      "location": "https://www.nist.gov/programs-projects/charpy-machine-verification-program",
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"
      ]
    },
    {
      "@type": [
        "npg:Document"
      ],
      "@id": "#ref:10.6028/NIST.IR.8211-upd",
      "refType": "IsSupplementTo",
      "location": "https://doi.org/10.6028/NIST.IR.8211-upd",
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"
      ],
      "title": "New software for the statistical analysis and qualification of NIST Charpy verification specimen lots",
      "issued": "2021-12-06",
      "citation": "Lucon, E. (2021). New software for the statistical analysis and qualification of NIST Charpy verification specimen lots (, Ed.). National Institute of Standards and Technology (U.S.). https://doi.org/10.6028/nist.ir.8211-upd\n"
    }
  ],
  "authors": [
    {
      "familyName": "Lucon",
      "fn": "Enrico Lucon",
      "givenName": "Enrico",
      "middleName": "",
      "affiliation": [
        {
          "title": "National Institute of Standards and Technology",
          "subunits": [
            "Applied Chemicals and Materials Division"
          ],
          "@type": "org:Organization",
          "@id": "ror:05xpvk416"
        }
      ],
      "orcid": "0000-0002-3021-4785",
      "@type": "foaf:Person"
    },
    {
      "familyName": "Eckhardt",
      "fn": "Allen Eckhardt",
      "givenName": "Allen",
      "middleName": "",
      "affiliation": [
        {
          "title": "National Institute of Standards and Technology",
          "subunits": [
            "Applied Chemicals and Materials Division"
          ],
          "@type": "org:Organization",
          "@id": "ror:05xpvk416"
        }
      ],
      "orcid": "0009-0009-7302-0559",
      "@type": "foaf:Person"
    },
    {
      "familyName": "Koepke",
      "fn": "Amanda Koepke",
      "givenName": "Amanda",
      "middleName": "",
      "affiliation": [
        {
          "title": "National Institute of Standards and Technology",
          "subunits": [
            "Statistical Engineering Division"
          ],
          "@type": "org:Organization",
          "@id": "ror:05xpvk416"
        }
      ],
      "orcid": "0000-0001-9515-0383",
      "@type": "foaf:Person"
    }
  ],
  "annotated": "2026-10-22T13:35:29.004399",
  "revised": "2026-10-22T13:35:29.004399",
  "issued": null,
  "firstIssued": "2026-10-22T13:35:29.004399"
}