{
  "_schema": "https://data.nist.gov/od/dm/nerdm-schema/v0.7#",
  "@context": [
    "https://data.nist.gov/od/dm/nerdm-pub-context.jsonld",
    {
      "@base": "ark:/88434/mds2-2933"
    }
  ],
  "@type": [
    "nrdp:DataPublication",
    "nrdp:PublicDataResource",
    "dcat:Dataset"
  ],
  "_extensionSchemas": [
    "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/PublicDataResource"
  ],
  "@id": "ark:/88434/mds2-2933",
  "ediid": "ark:/88434/mds2-2933",
  "version": "1.0.1",
  "doi": "doi:10.18434/mds2-2933",
  "title": "Additive Manufacturing Benchmark 2022 Schema ",
  "contactPoint": {
    "fn": "Lyle E. Levine",
    "hasEmail": "mailto:lyle.levine@nist.gov"
  },
  "modified": "2023-09-12",
  "status": "available",
  "landingPage": "https://data.nist.gov/od/id/mds2-2933",
  "description": [
    "This resource is the implementation in XML Schema [1] of a data model that describes the Additive Manufacturing Benchmark 2022 series data. \nIt provides a robust set of metadata for the build processes and their resulting specimens and for measurements made on these in the context of the AM Bench 2022 project.",
    "The schema was designed to support typical science questions which users of a database with metadata about the AM Bench results might wish to pose. The metadata include identifiers assigned to build products, derived specimens, and measurements; links to relevant journal publications, documents, and illustrations; provenance of specimens such as source materials and details of the build process; measurement geometry, instruments and other configurations used in measurements; and access information to raw and processed data as well as analysis descriptions of these datasets.",
    "This data model is an abstraction of these metadata, designed using the concepts of inheritance, normalization, and reusability of an object oriented language for ease of extensibility and maintenance. It is simple to incorporate new metadata as needed.",
    "A CDCS [2] database at NIST was filled with metadata provided by the contributors to the AM Bench project. They entered values for the metadata fields for an AM Bench measurement, specimen or build process in tabular spreadsheets. These entries were translated to XML documents compliant with the schema using a set of python scripts. The generated XML documents were loaded into the database with a persistent identifier (PID) assigned by the database.",
    "[1] https://www.w3.org/XML/Schema\n[2] https://www.nist.gov/itl/ssd/information-systems-group/configurable-data-curation-system-cdcs/about-cdcs"
  ],
  "keyword": [
    "data model",
    "additive manufacturing",
    "build plate",
    "material composition",
    "laser absorptivity",
    "radiography",
    "mechanical testing"
  ],
  "topic": [
    {
      "@type": "Concept",
      "scheme": "https://data.nist.gov/od/dm/nist-themes/v1.1",
      "tag": "Materials: Materials characterization"
    },
    {
      "@type": "Concept",
      "scheme": "https://data.nist.gov/od/dm/nist-themes/v1.1",
      "tag": "Materials: Modeling and computational material science"
    },
    {
      "@type": "Concept",
      "scheme": "https://data.nist.gov/od/dm/nist-themes/v1.1",
      "tag": "Materials: Metals"
    },
    {
      "@type": "Concept",
      "scheme": "https://data.nist.gov/od/dm/nist-themes/v1.1",
      "tag": "Materials: Polymers"
    },
    {
      "@type": "Concept",
      "scheme": "https://data.nist.gov/od/dm/nist-themes/v1.1",
      "tag": "Manufacturing: Additive manufacturing"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Materials: Metals",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Materials: Polymers",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Build Process: Machine performance",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Build Process: Process mapping",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Build Process: Powder bed fusion: Laser",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Build Process: Vat photopolymerization",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Post-build Process: Annealing",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Post-build Process: Curing",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Microstructure: In-situ characterization",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Microstructure: Ex-situ characterization",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Microstructure: Microstructure analysis",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Properties: Mechanical",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Properties: Composition",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Properties: Residual stress",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Properties: Rheology",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Properties: Thermal / kinetic",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Properties: Surface topography",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Properties: Surface roughness",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Performance: Fracture",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Performance: Geometric accuracy",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: In-situ: Build process",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: In-situ: Post-build process",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Ex-situ",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Microscopy: Optical",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Microscopy: Electron",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Diffraction: X-ray",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Diffraction: Neutron",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Diffraction: Electron",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: X-ray computed tomography",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Small-angle scattering",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Mechanical Testing",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Serial sectioning",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Dimensional metrology",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Contour method",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Profilometry",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Rheometry",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Spectroscopy",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Thermography",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Contact thermometry",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Composition analysis",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Radiography",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Characterization Approach: Machine vision",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Computation and Analysis: Process simulation",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Computation and Analysis: Material simulation",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Computation and Analysis: Property simulation",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Computation and Analysis: Performance simulation",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Computation and Analysis: Microstructural analysis",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Computation and Analysis: Multimodal data analysis: Multimodal registration",
      "@type": "Concept"
    },
    {
      "scheme": "https://data.nist.gov/od/dm/nist-themes-additivemanufacturing/v1.0",
      "tag": "Collaboration: AM-Bench",
      "@type": "Concept"
    }
  ],
  "accessLevel": "public",
  "license": "https://www.nist.gov/open/license",
  "publisher": {
    "name": "National Institute of Standards and Technology",
    "@type": "org:Organization"
  },
  "language": [
    "en"
  ],
  "bureauCode": [
    "006:55"
  ],
  "programCode": [
    "006:052"
  ],
  "_editStatus": "done",
  "theme": [
    "Materials: Materials characterization",
    "Materials: Modeling and computational material science",
    "Materials: Metals",
    "Materials: Polymers",
    "Manufacturing: Additive manufacturing"
  ],
  "components": [
    {
      "accessURL": "https://ambench2022.nist.gov/",
      "title": "AM Bench 2022 Metadata Catalog",
      "@type": [
        "nrdp:AccessPage",
        "dcat:Distribution"
      ],
      "@id": "#",
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/AccessPage"
      ]
    },
    {
      "@id": "cmps/AMMeasurement.xsd",
      "@type": [
        "nrdp:DataFile",
        "nrdp:DownloadableFile",
        "dcat:Distribution"
      ],
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"
      ],
      "filepath": "AMMeasurement.xsd",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-2933/AMMeasurement.xsd",
      "mediaType": "text/xml",
      "format": {
        "description": "xsd"
      },
      "description": "The schema for the metadata describing characterization measurements conducted in the AMBench 2022 project.",
      "title": "AMMeasurement.xsd",
      "size": 30929,
      "checksum": {
        "hash": "0db63ee107777b0094258d3bff1209e9a2db105a5d4e60001a42de4fd047a3ab",
        "algorithm": {
          "tag": "sha256",
          "@type": "Thing"
        }
      }
    },
    {
      "@id": "cmps/AMReference.xsd",
      "@type": [
        "nrdp:DataFile",
        "nrdp:DownloadableFile",
        "dcat:Distribution"
      ],
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"
      ],
      "filepath": "AMReference.xsd",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-2933/AMReference.xsd",
      "mediaType": "text/xml",
      "format": {
        "description": "xsd"
      },
      "description": "The schema  which contains a generic resource type 'AMResource' in the AM Bench project such as samples and measurements.  AMResource is the ultimate base type for other more explicit AM Bench documents. \n",
      "title": "AMReference.xsd",
      "size": 70989,
      "checksum": {
        "hash": "533ddc665b007bb071e0c4b92ac9d5f622ed1e566c82cb967d261c25a78f0ee1",
        "algorithm": {
          "tag": "sha256",
          "@type": "Thing"
        }
      }
    },
    {
      "@id": "cmps/AMBuild.xsd",
      "@type": [
        "nrdp:DataFile",
        "nrdp:DownloadableFile",
        "dcat:Distribution"
      ],
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"
      ],
      "filepath": "AMBuild.xsd",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-2933/AMBuild.xsd",
      "mediaType": "text/xml",
      "format": {
        "description": "xsd"
      },
      "description": "The schema for the metadata describing samples and build processes used in the AM Bench 2022 project.",
      "title": "AMBuild.xsd",
      "size": 35066,
      "checksum": {
        "hash": "e9e94b8b163e5c41680c01589c3406755f0588d1ac00a0c0012445f32c529ecf",
        "algorithm": {
          "tag": "sha256",
          "@type": "Thing"
        }
      }
    },
    {
      "@id": "cmps/AMDocs.xsd",
      "@type": [
        "nrdp:DataFile",
        "nrdp:DownloadableFile",
        "dcat:Distribution"
      ],
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"
      ],
      "filepath": "AMDocs.xsd",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-2933/AMDocs.xsd",
      "mediaType": "text/xml",
      "format": {
        "description": "xsd"
      },
      "description": "The schema which contains a root element for an AM Bench XML document. It wraps the more specific AM Bench resource documents including specimens and measurements.",
      "title": "AMDocs.xsd",
      "size": 6689,
      "checksum": {
        "hash": "195268131c273248d3e544cdb106c3a0c8872269943df7aab9ce585992ae2568",
        "algorithm": {
          "tag": "sha256",
          "@type": "Thing"
        }
      }
    },
    {
      "@id": "cmps/2933_README.txt",
      "@type": [
        "nrdp:DataFile",
        "nrdp:DownloadableFile",
        "dcat:Distribution"
      ],
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"
      ],
      "filepath": "2933_README.txt",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-2933/2933_README.txt",
      "mediaType": "text/plain",
      "format": {
        "description": "Plain text"
      },
      "description": "Description of the data files included in this data record",
      "title": "README file",
      "size": 8160,
      "checksum": {
        "hash": "5e4133f013c0332c982185e010604f7f4df6927230c13d437dcf7a7c4ecb78bf",
        "algorithm": {
          "tag": "sha256",
          "@type": "Thing"
        }
      }
    }
  ],
  "references": [
    {
      "@type": [
        "deo:BibliographicReference"
      ],
      "@id": "#ref:",
      "refType": "References",
      "location": "https://ambench2022.nist.gov/",
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"
      ]
    },
    {
      "@type": [
        "deo:BibliographicReference"
      ],
      "@id": "#ref:ambench",
      "refType": "References",
      "location": "https://www.nist.gov/ambench",
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"
      ]
    },
    {
      "@type": [
        "schema:Dataset"
      ],
      "@id": "#ref:10.18434/mds2-2525",
      "refType": "References",
      "location": "https://doi.org/10.18434/mds2-2525",
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"
      ],
      "title": "Asynchronous AM Bench 2022 Challenge Data: Real-time, simultaneous absorptance and high-speed Xray imaging",
      "issued": "2022-01-10",
      "citation": "Simonds, B. J., Tanner, J., Artusio-Glimpse, A., Williams, P. A., Parab, N., Zhao, C., & Sun, T. (2022). Asynchronous AM Bench 2022 Challenge Data: Real-time, simultaneous absorptance and high-speed Xray imaging (Version 1.3.1) [Data set]. National Institute of Standards and Technology. https://doi.org/10.18434/MDS2-2525"
    },
    {
      "@type": [
        "schema:Dataset"
      ],
      "@id": "#ref:10.18434/mds2-2587",
      "refType": "References",
      "location": "https://doi.org/10.18434/mds2-2587",
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"
      ],
      "title": "AM Bench 2022 challenge problem Subcontinuum Mesoscale Tensile Test (CHAL-AMB2022-04-MeTT)",
      "issued": "2022",
      "citation": "Benzing, J., Kafka, O., Moser, N., Weaver, J., Liew, L.-A., & Hrabe, N. (2022). AM Bench 2022 challenge problem Subcontinuum Mesoscale Tensile Test (CHAL-AMB2022-04-MeTT) (Version 1.4.1) [Data set]. National Institute of Standards and Technology. https://doi.org/10.18434/MDS2-2587"
    },
    {
      "@type": [
        "schema:Dataset"
      ],
      "@id": "#ref:10.18434/mds2-2588",
      "refType": "References",
      "location": "https://doi.org/10.18434/mds2-2588",
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"
      ],
      "title": "AM Bench 2022 challenge Macroscale Tensile Tests at Different Orientations (CHAL-AMB2022-04-MaTTO)",
      "issued": "2022-04-11",
      "citation": "Benzing, J., Moser, N., Kafka, O., Weaver, J., Derimow, N., & Hrabe, N. (2022). AM Bench 2022 challenge Macroscale Tensile Tests at Different Orientations (CHAL-AMB2022-04-MaTTO) (Version 1.1.0) [Data set]. National Institute of Standards and Technology. https://doi.org/10.18434/MDS2-2588"
    },
    {
      "@type": [
        "schema:Dataset"
      ],
      "@id": "#ref:10.18434/mds2-2607",
      "refType": "References",
      "location": "https://doi.org/10.18434/mds2-2607",
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"
      ],
      "title": "AM Bench 2022 3D Build Modeling Challenge Description Data (AMB2022-01)",
      "issued": "2022",
      "citation": "Lane, B., Levine, L., Deisenroth, D., Yeung, H., Tondare, V., Mekhontsev, S., & Neira, J. (2022). AM Bench 2022 3D Build Modeling Challenge Description Data (AMB2022-01) (Version 1.0.0) [Data set]. National Institute of Standards and Technology. https://doi.org/10.18434/MDS2-2607"
    },
    {
      "@type": [
        "schema:Dataset"
      ],
      "@id": "#ref:10.18434/mds2-2617",
      "refType": "References",
      "location": "https://doi.org/10.18434/mds2-2617",
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"
      ],
      "title": "AM Bench 2022 3D Build with Custom Laser Scan Strategies Modeling Challenge (AMB2022-02)",
      "issued": "2022",
      "citation": "Yeung, H., Lane, B., Deisenroth, D., & Mekhontsev, S. (2022). AM Bench 2022 3D Build with Custom Laser Scan Strategies Modeling Challenge (AMB2022-02) (Version 1.0.0) [Data set]. National Institute of Standards and Technology. https://doi.org/10.18434/MDS2-2617"
    },
    {
      "@type": [
        "schema:Dataset"
      ],
      "@id": "#ref:10.18434/mds2-2618",
      "refType": "References",
      "location": "https://doi.org/10.18434/mds2-2618",
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"
      ],
      "title": "AM Bench 2022 IN625 3D Build Microstructure Modeling Challenge Description Data (AMB2022-05)",
      "issued": "2022",
      "citation": "Schwalbach, E., Chapman, M., Shah, M., Uchic, M., Levine, L., Hrabe, N., Kafka, O., Moser, N., & Belak, J. (2022). AM Bench 2022 IN625 3D Build Microstructure Modeling Challenge Description Data (AMB2022-05) (Version 1.0.0) [Data set]. National Institute of Standards and Technology. https://doi.org/10.18434/MDS2-2618"
    },
    {
      "@type": [
        "schema:Dataset"
      ],
      "@id": "#ref:10.18434/mds2-2681",
      "refType": "References",
      "location": "https://doi.org/10.18434/mds2-2681",
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"
      ],
      "title": "Macroscale Compression at Different Temperatures and Orientations (CHAL-AMB2022-04-MaCTO)",
      "issued": "2022",
      "citation": "Carson, R., & Levine, L. (2022). Macroscale Compression at Different Temperatures and Orientations (CHAL-AMB2022-04-MaCTO) (Version 1.1.0) [Data set]. National Institute of Standards and Technology. https://doi.org/10.18434/MDS2-2681"
    },
    {
      "@type": [
        "schema:Dataset"
      ],
      "@id": "#ref:10.18434/mds2-2718",
      "refType": "References",
      "location": "https://doi.org/10.18434/mds2-2718",
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"
      ],
      "title": "AM Bench 2022 Measurement Results Data: Optical Microscopy of Laser-scanned Single Tracks and Pads (AMB2022-03)",
      "issued": "2022",
      "citation": "Weaver, J., Deisenroth, D., Mekhontsev, S., Lane, B., Levine, L., & Yeung, H. (2022). AM Bench 2022 Measurement Results Data: Optical Microscopy of Laser-scanned Single Tracks and Pads (AMB2022-03) (Version 1.0.0) [Data set]. National Institute of Standards and Technology. https://doi.org/10.18434/MDS2-2718"
    },
    {
      "@type": [
        "schema:Dataset"
      ],
      "@id": "#ref:10.18434/mds2-2760",
      "refType": "References",
      "location": "https://doi.org/10.18434/mds2-2760",
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"
      ],
      "title": "AM Bench 2022 ASTM E8 Macroscale Tension at Different Strain Rates on As-built IN625",
      "issued": "2022",
      "citation": "Habib, S. A., Weaver, J. S., Mates, S. P., & Levine, L. E. (2022). AM Bench 2022 ASTM E8 Macroscale Tension at Different Strain Rates on As-built IN625 (Version 1.0.0) [Data set]. National Institute of Standards and Technology. https://doi.org/10.18434/MDS2-2760"
    }
  ],
  "authors": [
    {
      "familyName": "Kim",
      "fn": "Jai Won  Kim",
      "givenName": "Jai Won",
      "middleName": "",
      "affiliation": [
        {
          "title": "Johns Hopkins University",
          "subunits": [
            "Institute of Data Intensive Engineering and Science"
          ],
          "@type": "org:Organization"
        }
      ],
      "orcid": "0000-0002-7006-4603",
      "@type": "foaf:Person"
    },
    {
      "familyName": "Levine",
      "fn": "Lyle  Levine",
      "givenName": "Lyle",
      "middleName": "",
      "affiliation": [
        {
          "title": "National Institute of Standards and Technology",
          "subunits": [
            "Material Measurement Laboratory/Materials Science and Engineering Division"
          ],
          "@type": "org:Organization",
          "@id": "ror:05xpvk416"
        }
      ],
      "orcid": "0000-0003-3448-4229",
      "@type": "foaf:Person"
    },
    {
      "familyName": "Lemson",
      "fn": "Gerard  Lemson",
      "givenName": "Gerard",
      "middleName": "",
      "affiliation": [
        {
          "title": "Johns Hopkins University",
          "subunits": [
            "Institute of Data Intensive Engineering and Science"
          ],
          "@type": "org:Organization"
        }
      ],
      "orcid": "0000-0001-5041-2458",
      "@type": "foaf:Person"
    },
    {
      "familyName": "Greene",
      "fn": "Gretchen  Greene",
      "givenName": "Gretchen",
      "middleName": "",
      "affiliation": [
        {
          "title": "National Institute of Standards and Technology",
          "subunits": [
            "Material Measurement Laboratory/Office of Data and Informatics"
          ],
          "@type": "org:Organization",
          "@id": "ror:05xpvk416"
        }
      ],
      "orcid": "0000-0002-2302-9442",
      "@type": "foaf:Person"
    },
    {
      "familyName": "Brady",
      "fn": "Kevin  Brady",
      "givenName": "Kevin",
      "middleName": "",
      "affiliation": [
        {
          "title": "National Institute of Standards and Technology",
          "subunits": [
            "Information Technology Laboratory/Software and Systems Division"
          ],
          "@type": "org:Organization",
          "@id": "ror:05xpvk416"
        }
      ],
      "orcid": "0000-0002-9271-1568",
      "@type": "foaf:Person"
    },
    {
      "familyName": "Long",
      "fn": "Benjamin  Long",
      "givenName": "Benjamin",
      "middleName": "",
      "affiliation": [
        {
          "title": "National Institute of Standards and Technology",
          "subunits": [
            "Information Technology Laboratory/Software and Systems Division"
          ],
          "@type": "org:Organization",
          "@id": "ror:05xpvk416"
        }
      ],
      "orcid": "0000-0002-4340-7674",
      "@type": "foaf:Person"
    },
    {
      "familyName": "Becker",
      "fn": "Chandler  Becker",
      "givenName": "Chandler",
      "middleName": "",
      "affiliation": [
        {
          "title": "National Institute of Standards and Technology",
          "subunits": [
            "Material Measurement Laboratory/Office of Data and Informatics"
          ],
          "@type": "org:Organization",
          "@id": "ror:05xpvk416"
        }
      ],
      "orcid": "0000-0002-3653-0199",
      "@type": "foaf:Person"
    },
    {
      "familyName": "Campbell",
      "fn": "Carelyn  Campbell",
      "givenName": "Carelyn",
      "middleName": "",
      "affiliation": [
        {
          "title": "National Institute of Standards and Technology",
          "subunits": [
            "Material Measurement Laboratory/Materials Science and Engineering Division"
          ],
          "@type": "org:Organization",
          "@id": "ror:05xpvk416"
        }
      ],
      "orcid": "0000-0003-0336-0944",
      "@type": "foaf:Person"
    },
    {
      "familyName": "Lane",
      "fn": "Brandon  Lane",
      "givenName": "Brandon",
      "middleName": "",
      "affiliation": [
        {
          "title": "National Institute of Standards and Technology",
          "subunits": [
            "Engineering Laboratory"
          ],
          "@type": "org:Organization",
          "@id": "ror:05xpvk416"
        }
      ],
      "orcid": "0000-0001-5153-1678",
      "@type": "foaf:Person"
    }
  ],
  "annotated": "2026-01-06T07:39:32.645998",
  "revised": "2024-01-18T17:24:16.959199",
  "issued": null,
  "firstIssued": "2024-01-18T17:24:16.959199",
  "releaseHistory": {
    "@id": "ark:/88434/mds2-2933/pdr:v",
    "@type": [
      "nrdr:ReleaseHistory"
    ],
    "hasRelease": [
      {
        "version": "1.0.0",
        "issued": "2023-09-12",
        "@id": "ark:/88434/mds2-2933/pdr:v/1.0.0",
        "location": "https://data.nist.gov/od/id/ark:/88434/mds2-2933/pdr:v/1.0.0",
        "description": "initial release"
      },
      {
        "version": "1.0.1",
        "issued": "2026-01-06",
        "@id": "ark:/88434/mds2-2933/pdr:v/1.0.1",
        "location": "https://data.nist.gov/od/id/ark:/88434/mds2-2933/pdr:v/1.0.1",
        "description": "added to additiveman collection"
      }
    ]
  },
  "isPartOf": [
    {
      "@type": [
        "nrda:ScienceTheme",
        "nrdp:PublicDataResource"
      ],
      "@id": "ark:/88434/pdr0-0003",
      "title": "Additive Manufacturing Data"
    }
  ]
}