{
  "_schema": "https://data.nist.gov/od/dm/nerdm-schema/v0.7#",
  "@context": [
    "https://data.nist.gov/od/dm/nerdm-pub-context.jsonld",
    {
      "@base": "ark:/88434/mds2-4087"
    }
  ],
  "@type": [
    "nrdp:DataPublication",
    "nrdp:PublicDataResource",
    "dcat:Dataset"
  ],
  "_extensionSchemas": [
    "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/PublicDataResource"
  ],
  "@id": "ark:/88434/mds2-4087",
  "ediid": "ark:/88434/mds2-4087",
  "version": "1.0.0",
  "doi": "doi:10.18434/mds2-4087",
  "title": "Evaluation of a new Prototype of Secondary Voltage Standard with a Programmable Josephson Voltage Standard",
  "contactPoint": {
    "fn": "Alain Rufenacht",
    "hasEmail": "mailto:alain.rufenacht@nist.gov"
  },
  "modified": "2026-02-03",
  "status": "available",
  "landingPage": "https://data.nist.gov/od/id/mds2-4087",
  "description": [
    "This paper evaluates the short-term and long-term performance of a new type of dc secondary voltage standard at 10 V by direct comparison to a programmable Josephson voltage standard. Allan deviation measurements indicated a noise floor of 4.5 nV, enabling potential new applications in voltage metrology and possibly reducing uncertainty along the dissemination chain from primary calibration laboratories to calibration laboratories."
  ],
  "keyword": [
    "Digital-analog conversion",
    "Measurement uncertainty",
    "Josephson junctions",
    "Standards",
    "Superconducting integrated circuits",
    "Voltage measurement."
  ],
  "topic": [
    {
      "@type": "Concept",
      "scheme": "https://data.nist.gov/od/dm/nist-themes/v1.1",
      "tag": "Metrology: Electrical/electromagnetic metrology"
    }
  ],
  "accessLevel": "public",
  "license": "https://www.nist.gov/open/license",
  "publisher": {
    "name": "National Institute of Standards and Technology",
    "@type": "org:Organization"
  },
  "language": [
    "en"
  ],
  "bureauCode": [
    "006:55"
  ],
  "programCode": [
    "006:052"
  ],
  "_editStatus": "done",
  "components": [
    {
      "@id": "cmps/Fig 2 Long-term stability.csv",
      "@type": [
        "nrdp:DataFile",
        "nrdp:DownloadableFile",
        "dcat:Distribution"
      ],
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"
      ],
      "filepath": "Fig 2 Long-term stability.csv",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/Fig%202%20Long-term%20stability.csv",
      "mediaType": "text/csv",
      "description": "Figure 2 presents Long-term stability data collected for the 10 V output voltage tap of two Z10 units (labelled Unit 1 and Unit 2) measured with the NIST Programmable Josephson Voltage Standard",
      "title": "Fig 2 Long-term stability.csv",
      "size": 524227,
      "checksum": {
        "hash": "483fe93a8fb951dd0dd0e1e91f64b8555f05ca2a1954802539bb18d445e0ea63",
        "algorithm": {
          "tag": "sha256",
          "@type": "Thing"
        }
      }
    },
    {
      "@id": "cmps/4087_README.txt",
      "@type": [
        "nrdp:DataFile",
        "nrdp:DownloadableFile",
        "dcat:Distribution"
      ],
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"
      ],
      "filepath": "4087_README.txt",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/4087_README.txt",
      "mediaType": "text/plain",
      "description": "Description of the data set",
      "title": "Read Me file",
      "size": 5292,
      "checksum": {
        "hash": "883265992da90455d5631178ebc6717ef51652842d64223e749f2ef6dd2e6319",
        "algorithm": {
          "tag": "sha256",
          "@type": "Thing"
        }
      }
    },
    {
      "@id": "cmps/Fig 1 AD and voltage stability.csv",
      "@type": [
        "nrdp:DataFile",
        "nrdp:DownloadableFile",
        "dcat:Distribution"
      ],
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"
      ],
      "filepath": "Fig 1 AD and voltage stability.csv",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/Fig%201%20AD%20and%20voltage%20stability.csv",
      "mediaType": "text/csv",
      "description": "Figure 1 presents the Allan deviation (AD) results (Fig. 1a) obtained at 10 V and 100 mV, and stability of the 10 V output of the Z10 (Unit 1) over a 24-hour period (Fig. 1b) measured with the NIST Programmable Josephson Voltage Standard",
      "title": "Fig 1 AD and voltage stability",
      "size": 10242,
      "checksum": {
        "hash": "a8728df7099398ddea90e4dc079b2db186baa1931944323dc61c706716e67e21",
        "algorithm": {
          "tag": "sha256",
          "@type": "Thing"
        }
      }
    },
    {
      "@id": "cmps/Fig 4 DAC 100 mV voltage stability.csv",
      "@type": [
        "nrdp:DataFile",
        "nrdp:DownloadableFile",
        "dcat:Distribution"
      ],
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"
      ],
      "filepath": "Fig 4 DAC 100 mV voltage stability.csv",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/Fig%204%20DAC%20100%20mV%20voltage%20stability.csv",
      "mediaType": "text/csv",
      "description": "Figure 4 presents the stability of the DAC voltage output at 100 mV over a 24-hour period measured with the NIST Programmable Josephson Voltage Standard",
      "title": "Fig 4 DAC 100 mV voltage stability.csv",
      "size": 7957,
      "checksum": {
        "hash": "cf4b8bcdbd3f820654ee33c61b5cff2d8e41beceb50168132f7561e7b76a1daa",
        "algorithm": {
          "tag": "sha256",
          "@type": "Thing"
        }
      }
    },
    {
      "@id": "cmps/Fig 3 DAC INL results.csv",
      "@type": [
        "nrdp:DataFile",
        "nrdp:DownloadableFile",
        "dcat:Distribution"
      ],
      "_extensionSchemas": [
        "https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"
      ],
      "filepath": "Fig 3 DAC INL results.csv",
      "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/Fig%203%20DAC%20INL%20results.csv",
      "mediaType": "text/csv",
      "description": "Figure 3 presents the Integral Non-Linearity (INL) of the DAC output measured with the NIST Programmable Josephson Voltage Standard",
      "title": "Fig 3 DAC INL results.csv",
      "size": 1907,
      "checksum": {
        "hash": "f58e751960bf3d2753067ebb8c067afde851f9ff1d49da31dd98f9a80465652a",
        "algorithm": {
          "tag": "sha256",
          "@type": "Thing"
        }
      }
    }
  ],
  "theme": [
    "Metrology: Electrical/electromagnetic metrology"
  ],
  "authors": [
    {
      "familyName": "Rufenacht",
      "fn": "Alain  Rufenacht",
      "givenName": "Alain",
      "middleName": "",
      "affiliation": [
        {
          "title": "National Institute of Standards and Technology",
          "@type": "org:Organization",
          "@id": "ror:05xpvk416"
        }
      ],
      "orcid": "0000-0002-1579-9738",
      "@type": "foaf:Person"
    },
    {
      "familyName": "Beuning",
      "fn": "Charles B Beuning",
      "givenName": "Charles",
      "middleName": "B",
      "affiliation": [
        {
          "title": "Beuning Labs LLC",
          "@type": "org:Organization"
        }
      ],
      "orcid": "",
      "@type": "foaf:Person"
    },
    {
      "familyName": "Johnson-Wilke",
      "fn": "Raegan L Johnson-Wilke",
      "givenName": "Raegan",
      "middleName": "L",
      "affiliation": [
        {
          "title": "National Institute of Standards and Technology",
          "@type": "org:Organization",
          "@id": "ror:05xpvk416"
        }
      ],
      "orcid": "0000-0001-7016-3946",
      "@type": "foaf:Person"
    }
  ],
  "annotated": "2026-03-17T13:47:09.037514",
  "revised": "2026-03-17T13:47:09.037514",
  "issued": null,
  "firstIssued": "2026-03-17T13:47:09.037514"
}