This MEMS Calculator determines the following thin film properties from data taken with an optical interferometer or comparable instrument: a) residual strain from fixed-fixed beams, b) strain gradient from cantilevers, c) step heights or thicknesses from step-height test structures, and d) in-plane lengths or deflections. Then, residual stress and stress gradient calculations can be made after an optical vibrometer or comparable instrument is used to obtain Young's modulus from resonating cantilevers or fixed-fixed beams. In addition, wafer bond strength is determined from micro-chevron test structures using a material test machine.
Research Areas
NIST R&D: Standards: Reference materialsElectronics: SemiconductorsStandards: Reference data
Keywords: ASTMMEMS 5 in 1MEMS CalculatorsMicro Electro Mechanical SystemsSemiconductor Equipment and Materials InternationalShow more...
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Version: 1.0
Cite this dataset
Richard Allen (2014), NIST MEMS Calculator - SRD 166, National Institute of Standards and Technology, http://pml.nist.gov/test-structures/MEMSCalculator.htm (Accessed 2025-06-17)
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