Release History: v1.0.0Released: 2024-04-11this version initial release
This collection portal provides finding aids for the CHIPS Metrology Exchange to Innovate for Semiconductors (METIS) digital assets including data, code, and a variety of resources. It spans multiple discipline areas: Materials Research, Semiconductors, Simulations, Microelectronics, and will evolve in alignment with the CHIPS Metrology program. In addition to NIST physical reference materials, these digital assets support commercial industry and partner laboratories validation of their analytical methods. The collection data is curated to promote provenance and traceability through use of standards and best practices in data driven systems.
Research Areas
NIST R&D: Materials: CeramicsStandards: Reference dataPhysics: Condensed matterMaterials: Modeling and computational material scienceElectronics: Thin-film electronicsShow more...
NIST CHIPS Metrology oveview, areas of research, policy, and practice
Datasets in this collection
Version: 1.0... First Released: 2024-04-11
Description Last Updated: 2024-04-11
Release History: v1.0.0Released: 2024-04-11this version initial release
Cite this collection
METIS Project Team (2024), CHIPS METIS Data Collection, National Institute of Standards and Technology, https://data.nist.gov/od/id/ark:/88434/pdr0-0002 (Accessed 2025-02-14)
Repository Metadata
Machine-readable descriptions of this collection are available in the following formats: